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George Mason University

2016-2017 University Catalog

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2016-2017 University Catalog

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ECE 682 - VLSI Test Concepts

Credits: 3
Not Repeatable for Credit
Offered by Electrical and Computer Engineering

Broad introduction to basic concepts, techniques, and tools of modern VLSI testing. Fundamentals of defect modeling, fault simulation, design for testability, built-in self-test techniques, and failure analysis. Test economics, physical defects and fault modeling, automated test pattern generation, fault simulation, design for test, built-in self test, memory test, PLD test, mixed-signal test, Iddq test, boundary scan and related standards, test synthesis, diagnosis and failure analysis, automated test equipment, embedded core test.

Prerequisite(s): ECE 586
Schedule Type: LAB,
LEC
Hours of Lecture or Seminar per week: 3
Hours of Lab or Studio per week: 0

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ECE 682 - VLSI Test Concepts